Low-leakage repeaters for noc interconnects

Proceedings - IEEE International Symposium on Circuits and Systems

Volumn , Issue , 2005, Pages 600-603

  Morgenshtein, Arkadiy ^a   Cidon, Israel ^a   Kolodny, Avinoam ^a   Ginosar, Ran ^a  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

AREA EFFICIENT; DUAL-VT; NETWORK ON CHIP; POWER REDUCTIONS; UTILIZATION RATES;

ELECTRIC NETWORK TOPOLOGY;

NETWORKS (CIRCUITS);

EID: 34748915409     PISSN: 02714310     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISCAS.2005.1464659     Document Type: Conference Paper

References (23)

1. W.J. Dally, B. Towles, DAC, 684-689, 2001.
2. P. Saxena, et al., IEEE Tran. CAD, 451- 463, April, 2004.
3. V. Adler, E.G. Friedman, IEEE Tran. CAS, no. 5, 607-616, May 1998.
4. J. Lillis et al., IEEE Int. Conf. CAD, 138-143, Nov. 1995.
5. P.P. Sotiriadis, A.P. Chandrakasan, IEEE Tran. CAS, 1280-1295, 2003.
6. L. Macchiarulo et al., ISLPED, 176 - 181, 2001.
7. E. Bolotin et al., J. Systems Architecture, 50:105-128, Feb. 2004.
8. S. Mutoh et al., IEEE JSSC, 30: 847-854, Aug. 1995.
9. L. Wei et al, IEEE Tran. VLSI Syst., 16-24, March, 1999.
10. K. Banerjee, A. Mehrotra, IEEE Tran. Elec. Devices, 49:2001-2007, 2002.
11. G. Chen, E.G. Friedman, SOCC, 335-339, Sep. 2004.
12. P. Kapur et al., DAC, 461-466, 2002.
13. I. Dobbelaere et al., IEEE JSSC, 30:1246-1253, Nov., 1995.
14. A. Nalamalpu et al., IEEE Tran. CAD, 21:50-62, Jan. 2002.
15. H. Kaul, D. Sylvester, IEEE Tran. VLSI Syst., 12: 464-476, May, 2004.
16. H. Deogun et al., IEEE/ACM Design Automation Conf., 779-782, 2004.
17. N. Magen et al., SLIP, 7-13, Feb. 2004.
18. H. J. Yoo, IEEE Tran. Circuits and Systems, 45(9):1263-1271, Sep. 1998.
19. J.T. Kao, A.P. Chandrakasan, IEEE JSSC, 35:1009-1018, July, 2000.
20. J.C. Park et al., PATMOS, 148-158, 2004.
21. H.B. Bakoglu, Adison-Wesley, 194-219, 1990.
22. BPTM- www.device.eecs.berkeley.edu/~ptm/introduction.html.
23. Y. Cao et al., IEEE/ACM CAD Conf., pp. 56-61, 2000.