메뉴 건너뛰기




Volumn , Issue , 2007, Pages 3872-3875

A fully programmable analog window comparator

Author keywords

[No Author keywords available]

Indexed keywords

ANALOG CIRCUITS; CMOS INTEGRATED CIRCUITS; ERROR ANALYSIS; INTEGRATED CIRCUIT LAYOUT;

EID: 34548857349     PISSN: 02714310     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/iscas.2007.377884     Document Type: Conference Paper
Times cited : (1)

References (18)
  • 4
    • 0026240869 scopus 로고
    • Analogue-digital window comparator with highly flexible programmability
    • J. E. Franca, "Analogue-digital window comparator with highly flexible programmability," IEE Electronics Letters, pp. 2063-2064, 1991.
    • (1991) IEE Electronics Letters , pp. 2063-2064
    • Franca, J.E.1
  • 5
    • 27944449670 scopus 로고    scopus 로고
    • Self-testable full range window comparator
    • Y. Zhang and M. W.T.Wong, "Self-testable full range window comparator," in Proc. Region 10 TENCON 2004, vol. 4, 2004, pp. 262-265.
    • (2004) Proc. Region 10 TENCON 2004 , vol.4 , pp. 262-265
    • Zhang, Y.1    Wong, M.W.T.2
  • 11
    • 33846660026 scopus 로고    scopus 로고
    • Automatic repositioning technique for digital cell based window comparators and implementation within mixed-signal dft schemes
    • _, "Automatic repositioning technique for digital cell based window comparators and implementation within mixed-signal dft schemes," in Proc. Intl. Symp. on Quality Electronic Design, 2003, pp. 431-437.
    • (2003) Proc. Intl. Symp. on Quality Electronic Design , pp. 431-437
    • Venuto, D.D.1    Ohletz, M.J.2    Ricco, B.3
  • 12
    • 0035373236 scopus 로고    scopus 로고
    • On-chip test for mixed-signal asics using two-mode comparators with bias-programmable reference voltages
    • D. D. Venuto and M. J. Ohletz, "On-chip test for mixed-signal asics using two-mode comparators with bias-programmable reference voltages," J. of Electronic Testing: Theory and Applications, vol. 17, pp. 243-253, 2001.
    • (2001) J. of Electronic Testing: Theory and Applications , vol.17 , pp. 243-253
    • Venuto, D.D.1    Ohletz, M.J.2
  • 13
    • 0142226120 scopus 로고    scopus 로고
    • An analog checker with dynamically adjustable error threshold for fully differential circuits
    • H. Stratigopoulos and Y. Makris, "An analog checker with dynamically adjustable error threshold for fully differential circuits," in Proc. VLSI Test Symposium, 2003, pp. 209-214.
    • (2003) Proc. VLSI Test Symposium , pp. 209-214
    • Stratigopoulos, H.1    Makris, Y.2
  • 15
    • 33746601203 scopus 로고    scopus 로고
    • An adaptive checker for the fully differential analog code
    • _, "An adaptive checker for the fully differential analog code," IEEE J. Solid-State Circuits, vol. 41, no. 6, pp. 1421-1429, 2006.
    • (2006) IEEE J. Solid-State Circuits , vol.41 , Issue.6 , pp. 1421-1429
    • Stratigopoulos, H.1    Makris, Y.2
  • 16
    • 18144383223 scopus 로고    scopus 로고
    • On-line testing field programmable analog array circuits
    • S. K. H. Wang and S. Tragoudas, "On-line testing field programmable analog array circuits," in Proc. International Test Conference, 2004, pp. 1340-1348.
    • (2004) Proc. International Test Conference , pp. 1340-1348
    • Wang, S.K.H.1    Tragoudas, S.2
  • 17
    • 27644539684 scopus 로고    scopus 로고
    • A methodology to perform online self-testing for field-programmable analog array circuits
    • A. Laknaur and H. Wang, "A methodology to perform online self-testing for field-programmable analog array circuits," IEEE Transactions on Instrumentation and Measurement, vol. 54, no. 5, pp. 1751-1760, 2005.
    • (2005) IEEE Transactions on Instrumentation and Measurement , vol.54 , Issue.5 , pp. 1751-1760
    • Laknaur, A.1    Wang, H.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.