Automatic repositioning technique for digital cell based window comparators and implementation within mixed-signal DfT schemes

Proceedings - International Symposium on Quality Electronic Design, ISQED

Volumn 2003-January, Issue , 2003, Pages 431-437

  De Venuto, D ^a   Ohletz, M J ^b   Ricco, B ^c  

^a POLITECNICO DI BARI   (Italy)

^b ON SEMICONDUCTOR   (United States)

^c UNIVERSITY OF BOLOGNA   (Italy)

Author keywords

Automotive engineering; Circuit testing; Clocks; Costs; Design for testability; Digital integrated circuits; Proposals; Railway safety; Test equipment; Voltage

Indexed keywords

AUTOMOTIVE ENGINEERING; CLOCKS; COMPARATORS (OPTICAL); COST ENGINEERING; COSTS; DESIGN FOR TESTABILITY; DIGITAL INTEGRATED CIRCUITS; ELECTRIC POTENTIAL; EQUIPMENT TESTING; INTEGRATED CIRCUIT TESTING; RAILROAD TRANSPORTATION; SAFETY TESTING;

AUTOMATED TEST EQUIPMENT; CIRCUIT TESTING; DIGITAL CELLS; PROPOSALS; RAILWAY SAFETY; SPECIFIC INFORMATION; TEST EQUIPMENTS; WINDOW COMPARATOR;

MIXED SIGNAL INTEGRATED CIRCUITS;

EID: 33846660026     PISSN: 19483287     EISSN: 19483295     Source Type: Conference Proceeding    
DOI: 10.1109/ISQED.2003.1194771     Document Type: Conference Paper

References (11)

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