An adaptive checker for the fully differential analog code

IEEE Journal of Solid-State Circuits

Volumn 41, Issue 6, 2006, Pages 1421-1428

  Stratigopoulos, Haralampos G D ^a,b   Makris, Yiorgos ^a,b  

^a IEEE   (United States)

^b Yale University   (United States)

Author keywords

Analog circuit testing; Checkers; Concurrent error detection; Fully differential circuits

Indexed keywords

ANALOG CIRCUIT TESTING; CHECKERS; CONCURRENT ERROR DETECTION; FULLY DIFFERENTIAL CIRCUITS;

CMOS INTEGRATED CIRCUITS; CODES (SYMBOLS); DC POWER TRANSMISSION; ERROR DETECTION; THRESHOLD VOLTAGE;

ANALOG DIFFERENTIAL ANALYZERS;

EID: 33746601203     PISSN: 00189200     EISSN: None     Source Type: Journal    
DOI: 10.1109/JSSC.2006.874272     Document Type: Article

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