Testing of analogue circuits via (standard) digital gates

Proceedings - International Symposium on Quality Electronic Design, ISQED

Volumn 2002-January, Issue , 2002, Pages 112-119

  De Venuto, D ^a   Ohletz, M J ^b   Ricco B ^c  

^a POLITECNICO DI BARI   (Italy)

^b LUCENT TECHNOLOGIES   (United States)

^c UNIVERSITY OF BOLOGNA   (Italy)

Author keywords

Aerospace testing; Automotive engineering; Circuit testing; Costs; Design for testability; Digital integrated circuits; Logic gates; Proposals; Software libraries; Voltage

Indexed keywords

ANALOG CIRCUITS; AUTOMOTIVE ENGINEERING; CAPACITANCE; COST ENGINEERING; COSTS; DESIGN FOR TESTABILITY; DIGITAL INTEGRATED CIRCUITS; ELECTRIC POTENTIAL; INTEGRATED CIRCUIT TESTING; LOGIC GATES; SOFTWARE TESTING;

CIRCUIT TESTING; DIGITAL GATES; GATE CAPACITANCE; OBSERVATION WINDOW; PROPOSALS; SOFTWARE LIBRARIES; TEST INPUTS; WINDOW COMPARATOR;

DIGITAL LIBRARIES;

EID: 0041745614     PISSN: 19483287     EISSN: 19483295     Source Type: Conference Proceeding    
DOI: 10.1109/ISQED.2002.996709     Document Type: Conference Paper

References (10)

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