An analog checker with input-relative tolerance for duplicate signals

Journal of Electronic Testing: Theory and Applications (JETTA)

Volumn 20, Issue 5 SPEC.ISS., 2004, Pages 479-488

  Stratigopoulos, Haralampos G D ^a   Makris, Yiorgos ^a  

^a Yale University   (United States)

Author keywords

Analog checkers; Analog test; Concurrent test; On line test

Indexed keywords

ANALOG TO DIGITAL CONVERSION; CAPACITORS; CODES (SYMBOLS); NETWORKS (CIRCUITS); RELIABILITY; RESISTORS; SIGNAL PROCESSING; STATISTICAL METHODS;

ANALOG CHECKERS; ANALOG TEST; CONCURRENT TEST; ON-LINE TEST;

ERROR DETECTION;

EID: 4944263672     PISSN: 09238174     EISSN: None     Source Type: Journal    
DOI: 10.1023/B:JETT.0000042512.77744.d5     Document Type: Conference Paper

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