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Volumn , Issue , 1998, Pages 290-295

Approach to the on-line testing of operational amplifiers

Author keywords

[No Author keywords available]

Indexed keywords

BUILT-IN DETECTORS;

EID: 0032291010     PISSN: 10817735     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (11)

References (13)
  • 2
    • 0027611753 scopus 로고
    • Concurrent error detection and fault-tolerance in linear analog circuits using continuous checksums
    • June
    • A. Chatterjee, "Concurrent Error Detection and Fault-Tolerance in Linear Analog Circuits using Continuous Checksums", IEEE Transactions on VLSI Systems, Vol.1, No.2, June 1993, pp. 138-150.
    • (1993) IEEE Transactions on VLSI Systems , vol.1 , Issue.2 , pp. 138-150
    • Chatterjee, A.1
  • 3
    • 0012931529 scopus 로고
    • Test generation and concurrent error detection in current-mode A/D converter
    • S. Krishnan, S. Sahli and CH. Wey, "Test Generation and Concurrent Error Detection in Current-Mode A/D Converter", International Test Conference, 1992, pp. 312-320.
    • (1992) International Test Conference , pp. 312-320
    • Krishnan, S.1    Sahli, S.2    Wey, C.H.3
  • 4
    • 0142164154 scopus 로고
    • Finitely self-checking circuits and their applications on current sensors
    • M. Nicolaidis, "Finitely Self-Checking Circuits and their Applications on Current Sensors", VLSI Test Symposium, 1993, pp 66-69.
    • (1993) VLSI Test Symposium , pp. 66-69
    • Nicolaidis, M.1
  • 9
    • 0028370075 scopus 로고
    • A very high-frequency CMOS complementary folded cascode amplifier
    • February
    • R.E. Vallee and E.I. El-Masry, "A Very High-Frequency CMOS Complementary Folded Cascode Amplifier", IEEE Journal of Solid-State Circuits, Vol. 29, No. 2, February 1994, pp. 130-133.
    • (1994) IEEE Journal of Solid-State Circuits , vol.29 , Issue.2 , pp. 130-133
    • Vallee, R.E.1    El-Masry, E.I.2
  • 10
    • 0030192280 scopus 로고    scopus 로고
    • Compact CMOS constant-gm railt-to-rail input stage with gm control by an electronic zener diode
    • R. Hogervorst, J.P. Tero and J.H. Huijsing, "Compact CMOS Constant-gm Railt-to-Rail Input Stage with gm Control by an Electronic Zener Diode", IEEE Journal of Solid-State Circuits,Vol. 31, No. 7, 1996, pp. 1035-1040.
    • (1996) IEEE Journal of Solid-State Circuits , vol.31 , Issue.7 , pp. 1035-1040
    • Hogervorst, R.1    Tero, J.P.2    Huijsing, J.H.3
  • 13
    • 0030685979 scopus 로고    scopus 로고
    • Functional test pattern generation for CMOS operational amplifier
    • S.J. Chang, C.L. Lee and JE. Chen, "Functional Test Pattern Generation for CMOS Operational Amplifier", VLSI Test Symposium, 1997, pp 267-272.
    • (1997) VLSI Test Symposium , pp. 267-272
    • Chang, S.J.1    Lee, C.L.2    Chen, J.E.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.