-
2
-
-
0027611753
-
Concurrent error detection and fault-tolerance in linear analog circuits using continuous checksums
-
June
-
A. Chatterjee, "Concurrent Error Detection and Fault-Tolerance in Linear Analog Circuits using Continuous Checksums", IEEE Transactions on VLSI Systems, Vol.1, No.2, June 1993, pp. 138-150.
-
(1993)
IEEE Transactions on VLSI Systems
, vol.1
, Issue.2
, pp. 138-150
-
-
Chatterjee, A.1
-
3
-
-
0012931529
-
Test generation and concurrent error detection in current-mode A/D converter
-
S. Krishnan, S. Sahli and CH. Wey, "Test Generation and Concurrent Error Detection in Current-Mode A/D Converter", International Test Conference, 1992, pp. 312-320.
-
(1992)
International Test Conference
, pp. 312-320
-
-
Krishnan, S.1
Sahli, S.2
Wey, C.H.3
-
4
-
-
0142164154
-
Finitely self-checking circuits and their applications on current sensors
-
M. Nicolaidis, "Finitely Self-Checking Circuits and their Applications on Current Sensors", VLSI Test Symposium, 1993, pp 66-69.
-
(1993)
VLSI Test Symposium
, pp. 66-69
-
-
Nicolaidis, M.1
-
8
-
-
0012934218
-
Mixed-signal circuits and boards for high safety applications
-
M. Lubaszewski, V. Kolarik, S. Mir, C. Nielsen and B. Courtois, "Mixed-Signal Circuits and Boards for High Safety Applications", European Design and Test Conference, 1995, pp. 34-39.
-
(1995)
European Design and Test Conference
, pp. 34-39
-
-
Lubaszewski, M.1
Kolarik, V.2
Mir, S.3
Nielsen, C.4
Courtois, B.5
-
9
-
-
0028370075
-
A very high-frequency CMOS complementary folded cascode amplifier
-
February
-
R.E. Vallee and E.I. El-Masry, "A Very High-Frequency CMOS Complementary Folded Cascode Amplifier", IEEE Journal of Solid-State Circuits, Vol. 29, No. 2, February 1994, pp. 130-133.
-
(1994)
IEEE Journal of Solid-State Circuits
, vol.29
, Issue.2
, pp. 130-133
-
-
Vallee, R.E.1
El-Masry, E.I.2
-
10
-
-
0030192280
-
Compact CMOS constant-gm railt-to-rail input stage with gm control by an electronic zener diode
-
R. Hogervorst, J.P. Tero and J.H. Huijsing, "Compact CMOS Constant-gm Railt-to-Rail Input Stage with gm Control by an Electronic Zener Diode", IEEE Journal of Solid-State Circuits,Vol. 31, No. 7, 1996, pp. 1035-1040.
-
(1996)
IEEE Journal of Solid-State Circuits
, vol.31
, Issue.7
, pp. 1035-1040
-
-
Hogervorst, R.1
Tero, J.P.2
Huijsing, J.H.3
-
11
-
-
0029310405
-
Analog checkers with absolute and relative tolerances
-
V. Kolarik, S. Mir, M. Lubaszewski, and B. Courtois, "Analog Checkers with Absolute and Relative Tolerances", IEEE Trans. CAD of ICs and Systems, Vol. 14. No. 5, 1995, pp. 607-612.
-
(1995)
IEEE Trans. CAD of ICs and Systems
, vol.14
, Issue.5
, pp. 607-612
-
-
Kolarik, V.1
Mir, S.2
Lubaszewski, M.3
Courtois, B.4
-
12
-
-
0030244281
-
Fault-based testing and diagnosis of balanced filters
-
S. Mir, M. Lubaszewski, V. Kolarik, and B. Courtois, "Fault-Based Testing and Diagnosis of Balanced Filters", Journal of Analog Integrated Circuits and Signal Processing, KAP, 1996, pp. 5-19.
-
(1996)
Journal of Analog Integrated Circuits and Signal Processing, KAP
, pp. 5-19
-
-
Mir, S.1
Lubaszewski, M.2
Kolarik, V.3
Courtois, B.4
-
13
-
-
0030685979
-
Functional test pattern generation for CMOS operational amplifier
-
S.J. Chang, C.L. Lee and JE. Chen, "Functional Test Pattern Generation for CMOS Operational Amplifier", VLSI Test Symposium, 1997, pp 267-272.
-
(1997)
VLSI Test Symposium
, pp. 267-272
-
-
Chang, S.J.1
Lee, C.L.2
Chen, J.E.3
|