Compact modeling of noise in CMOS

Proceedings of the Custom Integrated Circuits Conference

Volumn , Issue , 2006, Pages 711-716

  Scholten, A J ^a   Van Langevelde, R ^a   Tiemeijer, L F ^a   Klaassen, D B M ^a  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

MATHEMATICAL MODELS; NUMERICAL METHODS; PARAMETER ESTIMATION; SPURIOUS SIGNAL NOISE;

BENCHMARK TESTS; COMPACT MODELING;

CMOS INTEGRATED CIRCUITS;

EID: 34548818215     PISSN: 08865930     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CICC.2006.320898     Document Type: Conference Paper

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