Improved Y-factor method for wide-band on-wafer noise-parameter measurements

IEEE Transactions on Microwave Theory and Techniques

Volumn 53, Issue 9, 2005, Pages 2917-2924

  Tiemeijer, Luuk F ^a   Havens, Ramon J ^a   De Kort, Randy ^a   Scholten, Andries J ^a  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

Calibration; Deembedding; Integrated circuits; On wafer microwave noise measurements; Reverse error analysis

Indexed keywords

CALIBRATION; ELECTRIC IMPEDANCE; ELECTRON MOBILITY; INTEGRATED CIRCUITS; TRANSISTORS; UNCERTAIN SYSTEMS;

DEEMBEDDING; ON-WAFER MICROWAVE NOISE MEASUREMENTS; REVERSE ERROR ANALYSIS; Y-FACTOR METHOD;

SPURIOUS SIGNAL NOISE;

EID: 27744532385     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMTT.2005.854243     Document Type: Conference Paper

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