Investigation the effects of the excess Pb content and annealing conditions on the microstructure and ferroelectric properties of PZT (52-48) films prepared by sol-gel method

Applied Surface Science

Volumn 253, Issue 3, 2006, Pages 1500-1505

  Zhu, Chen ^a,b   Yong, Zeng ^c   Chentao, Yang ^b   Bangchao, Yang ^b  

^a CHENGDU UNIVERSITY OF INFORMATION TECHNOLOGY   (China)

^b UNIVERSITY OF ELECTRONIC SCIENCE AND TECHNOLOGY OF CHINA   (China)

^c SOUTHWEST UNIVERSITY FOR NATIONALITIES   (China)

Author keywords

Ferroelectric property; PbO volatilization; Perovskite; PZT; Seeding layer; Sol gel

Indexed keywords

ANNEALING; ATOMIC FORCE MICROSCOPY; CRYSTALLIZATION; FERROELECTRICITY; LEAD COMPOUNDS; MICROSTRUCTURE; SOL-GELS; VAPORIZATION; X RAY PHOTOELECTRON SPECTROSCOPY;

ANNEALING CONDITIONS; CRYSTALLIZATION TEMPERATURE; FERROELECTRIC PROPERTY; SEEDING LAYERS;

THIN FILMS;

EID: 33750734661     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2006.02.033     Document Type: Article

References (9)

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