Dependence of fracture toughness on annealing temperature in Pb(Zr0.52Ti0.48)O3 thin films produced by metal organic decomposition

Journal of Materials Research

Volumn 18, Issue 3, 2003, Pages 578-584

  Zheng, X J ^a   Zhou, Y C ^a   Zhong, H ^b  

^a XIANGTAN UNIVERSITY   (China)

^b TSINGHUA UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; DECOMPOSITION; FERROELECTRICITY; FRACTURE TOUGHNESS; HYSTERESIS; LEAD COMPOUNDS; MICROSTRUCTURE; PIEZOELECTRIC MATERIALS; X RAY DIFFRACTION ANALYSIS;

METAL ORGANIC DECOMPOSITION;

THIN FILMS;

EID: 0037812533     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/JMR.2003.0075     Document Type: Article

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