High resolution transmission electron microscopy of InN

Applied Physics Letters

Volumn 91, Issue 10, 2007, Pages

  Bartel, T P ^a   Kisielowski, C ^a   Specht, P ^b   Shubina, T V ^c   Jmerik, V N ^c   Ivanov, S V ^c  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

^c IOFFE INSTITUTE   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

BEAM QUALITY; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; IMAGE ANALYSIS; INCLUSIONS; MOLECULAR BEAM EPITAXY; PHOTOLUMINESCENCE SPECTROSCOPY;

HEXAGONAL INN LAYERS; IMAGE SIMULATION; INN CRYSTALS; NANOMETERS; NANOSCOPIC METALLIC INDIUM INCLUSIONS;

INDIUM COMPOUNDS;

EID: 34548494570     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2779843     Document Type: Article

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