Face centered cubic indium nano-particles studied by UHV-transmission electron microscopy

Surface Science

Volumn 476, Issue 1-2, 2001, Pages 107-114

  Oshima, Yoshifumi ^a   Nangou, Tomoko ^a   Hirayama, Hiroyuki ^a   Takayanagi, Kunio ^a  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

COOLING; CRYSTAL ORIENTATION; MORPHOLOGY; NANOSTRUCTURED MATERIALS; STRESS ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY; VACUUM;

ULTRAHIGH VACUUM TRANSMISSION ELECTRON MICROSCOPY (UHV-TEM);

SEMICONDUCTING INDIUM COMPOUNDS;

EID: 0035277890     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(00)01122-5     Document Type: Article

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