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Volumn 91, Issue 9, 2007, Pages

Electrical switching and in situ Raman scattering studies on the set-reset processes in Ge-Te-Si glass

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENTS; ELECTRIC FIELD EFFECTS; GLASS; RAMAN SCATTERING;

EID: 34548447595     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2770770     Document Type: Article
Times cited : (20)

References (17)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.