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Volumn 91, Issue 9, 2007, Pages

Formation mechanisms of low-resistance and thermally stable PdNiPdRu Ohmic contacts to Mg-doped Al0.15 Ga0.85 N

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CARRIER TRANSPORT; CONTACT RESISTANCE; DOPING (ADDITIVES); MAGNESIUM; SURFACE ROUGHNESS; THERMODYNAMIC STABILITY; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 34548396318     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2778452     Document Type: Article
Times cited : (12)

References (17)
  • 15
    • 34548450504 scopus 로고    scopus 로고
    • 3rd ed. (Springer, Berlin, Germany
    • O. Madelung, Semiconductors: Data Handbook, 3rd ed. (Springer, Berlin, Germany, 2004), Vol. 2, p. 352.
    • (2004) Semiconductors: Data Handbook , vol.2 , pp. 352
    • Madelung, O.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.