Thickness dependence of domain switching of ferroelectric PbZr 0.35Ti0.65O3 thin film by scanning probe microscopy

Journal of the Korean Physical Society

Volumn 51, Issue 2 PART I, 2007, Pages 687-691

  Kim, C H ^a   Song, K S ^a   Moon, H B ^a   Son, J Y ^a   Kim, Bog G ^a   Cho, J H ^a  

^a Pusan National University   (South Korea)

Author keywords

Domain switching; EFM; Ferroelectric thin film; KFM; PEM; PZT

Indexed keywords

EID: 34548306870     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: 10.3938/jkps.51.687     Document Type: Article

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