Piezoresponse force microscopy studies of nanoscale domain structures in ferroelectric thin film

Materials Science and Engineering: B

Volumn 120, Issue 1-3, 2005, Pages 104-108

  Zeng, H R ^a   Yu, H F ^a   Tang, X G ^b   Chu, R Q ^a   Li, G R ^a   Yin, Q R ^a  

^a SHANGHAI INSTITUTE OF CERAMICS   (China)

^b GUANGDONG UNIVERSITY OF TECHNOLOGY   (China)

Author keywords

Ferroelectric thin film; Nanoscale displacement; Nanoscale domain; Scanning force microscope

Indexed keywords

FERROELECTRIC THIN FILMS; GRAIN SIZE AND SHAPE; IMAGING TECHNIQUES; OPTICAL MICROSCOPY; SCANNING; VISUALIZATION;

NANOSCALE DISPLACEMENT; NANOSCALE DOMAIN; PIEZORESPONSE FORCE MICROSCOPY;

NANOSTRUCTURED MATERIALS;

EID: 18944365416     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mseb.2005.02.021     Document Type: Conference Paper

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