-
1
-
-
0142037327
-
Imprint of sub-25 nm vias and trenches in polymers
-
Chou S.Y., et al. Imprint of sub-25 nm vias and trenches in polymers. Appl. Phys. Lett. 76 (1995) 3114-3116
-
(1995)
Appl. Phys. Lett.
, vol.76
, pp. 3114-3116
-
-
Chou, S.Y.1
-
2
-
-
0030570065
-
Imprint lithography with 25-nanometer resolution
-
Chou S.Y., et al. Imprint lithography with 25-nanometer resolution. Science 272 (1996) 85-87
-
(1996)
Science
, vol.272
, pp. 85-87
-
-
Chou, S.Y.1
-
3
-
-
0012752163
-
Sub-10 nm imprint lithography and application
-
Chou S.Y., et al. Sub-10 nm imprint lithography and application. J. Vac. Sci. Technol. 15 (1997) 2897-2904
-
(1997)
J. Vac. Sci. Technol.
, vol.15
, pp. 2897-2904
-
-
Chou, S.Y.1
-
4
-
-
0345979435
-
Formation and structure of self-assembled monolayers
-
Ulman A. Formation and structure of self-assembled monolayers. Chem. Rev. 96 (1996) 1533-1554
-
(1996)
Chem. Rev.
, vol.96
, pp. 1533-1554
-
-
Ulman, A.1
-
5
-
-
33751158455
-
Intrinsic relationship between molecular structure in self-assembled n-alkylsiloxane monolayers and deposition temperature
-
Parikh A.N., et al. Intrinsic relationship between molecular structure in self-assembled n-alkylsiloxane monolayers and deposition temperature. J. Phys. Chem. 98 (1994) 7577-7590
-
(1994)
J. Phys. Chem.
, vol.98
, pp. 7577-7590
-
-
Parikh, A.N.1
-
6
-
-
0026238539
-
Moisture absorption characteristics of organosiloxane self-assembled monolayers
-
Angst D.L., and Simmons G.W. Moisture absorption characteristics of organosiloxane self-assembled monolayers. Langmuir 7 (1991) 2236-2242
-
(1991)
Langmuir
, vol.7
, pp. 2236-2242
-
-
Angst, D.L.1
Simmons, G.W.2
-
7
-
-
0029945866
-
An AFM study of the effects of silanization temperature, hydration, and annealing on the nucleation and aggregation of condensed OTS domains on mica
-
Brit D.W., and Hlady V. An AFM study of the effects of silanization temperature, hydration, and annealing on the nucleation and aggregation of condensed OTS domains on mica. J. Colloid Interface Sci. 178 (1996) 775-784
-
(1996)
J. Colloid Interface Sci.
, vol.178
, pp. 775-784
-
-
Brit, D.W.1
Hlady, V.2
-
8
-
-
0028521762
-
Role of solvent on the silanization of glass with octadecyltrichlorosilane
-
McGovern M.E., et al. Role of solvent on the silanization of glass with octadecyltrichlorosilane. Langmuir 10 (1994) 3607-3614
-
(1994)
Langmuir
, vol.10
, pp. 3607-3614
-
-
McGovern, M.E.1
-
9
-
-
3042842463
-
Vapor phase anti-stiction coatings for MEMS
-
Ashurst W.R., et al. Vapor phase anti-stiction coatings for MEMS. IEEE Trans. Dev. Mater. Reliabil. 3 (2003) 173-178
-
(2003)
IEEE Trans. Dev. Mater. Reliabil.
, vol.3
, pp. 173-178
-
-
Ashurst, W.R.1
-
10
-
-
0036643642
-
Improving stamps for 10 nm level wafer scale nanoimprint lithography
-
Beck M., et al. Improving stamps for 10 nm level wafer scale nanoimprint lithography. Microelectron. Eng. 61-62 (2002) 441-448
-
(2002)
Microelectron. Eng.
, vol.61-62
, pp. 441-448
-
-
Beck, M.1
-
11
-
-
0033742679
-
Self-assembled monolayers as anti-stiction coatings for MEMS: characteristics and recent developments
-
Maboudian R., et al. Self-assembled monolayers as anti-stiction coatings for MEMS: characteristics and recent developments. Sens. Actuators A-Phys. 82 (2000) 219-223
-
(2000)
Sens. Actuators A-Phys.
, vol.82
, pp. 219-223
-
-
Maboudian, R.1
-
12
-
-
0035450059
-
Fabrication of quantum point contacts and quantum dots by imprint lithography
-
Martini I., et al. Fabrication of quantum point contacts and quantum dots by imprint lithography. Microelectron. Eng. 57-58 (2001) 397-403
-
(2001)
Microelectron. Eng.
, vol.57-58
, pp. 397-403
-
-
Martini, I.1
-
13
-
-
17344382000
-
Anti-adhesive layers on nickel stamps for nanoimprint lithography
-
Park S., et al. Anti-adhesive layers on nickel stamps for nanoimprint lithography. Microelectron. Eng. 73-74 (2004) 196-201
-
(2004)
Microelectron. Eng.
, vol.73-74
, pp. 196-201
-
-
Park, S.1
-
14
-
-
15744398693
-
Wafer-based nanostructure manufacturing for integrated nanooptic devices
-
Wang J.J., et al. Wafer-based nanostructure manufacturing for integrated nanooptic devices. J. Lightwave Technol. 23 (2005) 474-485
-
(2005)
J. Lightwave Technol.
, vol.23
, pp. 474-485
-
-
Wang, J.J.1
-
15
-
-
33244462833
-
Sacrificial film-assisted nanoimprint lithography
-
Xu Y., et al. Sacrificial film-assisted nanoimprint lithography. Microelectron. Eng. 83 (2006) 542-546
-
(2006)
Microelectron. Eng.
, vol.83
, pp. 542-546
-
-
Xu, Y.1
-
16
-
-
33646068393
-
Superhydrophobic surfaces fabricated by nanoimprint lithography
-
Pozzato A., et al. Superhydrophobic surfaces fabricated by nanoimprint lithography. Microelectron. Eng. 83 (2006) 884-888
-
(2006)
Microelectron. Eng.
, vol.83
, pp. 884-888
-
-
Pozzato, A.1
-
17
-
-
33645289185
-
Isolated, sealed nanofluidic channels formed by combinatorial-mould nanoimprint lithography
-
Dumond J.J., et al. Isolated, sealed nanofluidic channels formed by combinatorial-mould nanoimprint lithography. Nanotechnology 17 (2006) 1975-1980
-
(2006)
Nanotechnology
, vol.17
, pp. 1975-1980
-
-
Dumond, J.J.1
-
18
-
-
33749381041
-
Scaling of diffusion-mediated island growth in iron-on-iron homoepitaxy
-
Stroscio J.A., and Pierce D.T. Scaling of diffusion-mediated island growth in iron-on-iron homoepitaxy. Phys. Rev. B 49 (1994) 8522-8525
-
(1994)
Phys. Rev. B
, vol.49
, pp. 8522-8525
-
-
Stroscio, J.A.1
Pierce, D.T.2
-
19
-
-
0032649191
-
3 alignment
-
3 alignment. Langmuir 15 (1999) 4321-4323
-
(1999)
Langmuir
, vol.15
, pp. 4321-4323
-
-
Nishino, T.1
-
20
-
-
0032098211
-
Alkyltrichlorosilane-based self-assembled monolayer films for stiction reduction in silicon micromachines
-
Srinivasan U., et al. Alkyltrichlorosilane-based self-assembled monolayer films for stiction reduction in silicon micromachines. J. Microelectromech. Syst. 7 (1998) 252-260
-
(1998)
J. Microelectromech. Syst.
, vol.7
, pp. 252-260
-
-
Srinivasan, U.1
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