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Volumn , Issue , 2007, Pages 639-644

Investigating crosstalk in sub-threshold circuits

Author keywords

[No Author keywords available]

Indexed keywords

BICMOS TECHNOLOGY; COMPUTER SIMULATION; ELECTRIC POTENTIAL; ENERGY DISSIPATION; MICROPROCESSOR CHIPS; SENSITIVITY ANALYSIS;

EID: 34548120835     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISQED.2007.95     Document Type: Conference Paper
Times cited : (11)

References (11)
  • 1
    • 25144514874 scopus 로고    scopus 로고
    • Modeling and Sizing for Minimum Enery Operation in Subthreshold Circuits
    • Sep
    • B.H. Calhoun and A. Chandrakasan, "Modeling and Sizing for Minimum Enery Operation in Subthreshold Circuits", IEEE Journal of Solid-State Circuits, Vol. 40, NO. 9, Sep 2005, pp. 1778-1786.
    • (2005) IEEE Journal of Solid-State Circuits , vol.40 , Issue.9 , pp. 1778-1786
    • Calhoun, B.H.1    Chandrakasan, A.2
  • 3
    • 16244376164 scopus 로고    scopus 로고
    • Device Optimization for Ultra-Low Power Digital Sub-Threshold Operation
    • Aug
    • B.C. Paul, A. Roychowdhury, and K. Roy, "Device Optimization for Ultra-Low Power Digital Sub-Threshold Operation", ISLPED, Aug 2004, pp. 96-101.
    • (2004) ISLPED , pp. 96-101
    • Paul, B.C.1    Roychowdhury, A.2    Roy, K.3
  • 4
    • 33747042922 scopus 로고    scopus 로고
    • Robust Design of High Fan-In/Out Subthreshold Circuits
    • J. Chen, L.T. Clark, and Y. Cao, "Robust Design of High Fan-In/Out Subthreshold Circuits", IEEE Proceedings ICCD, 2005.
    • (2005) IEEE Proceedings ICCD
    • Chen, J.1    Clark, L.T.2    Cao, Y.3
  • 5
    • 0026901563 scopus 로고
    • CMOS Device Modeling for Subthreshold Circuits
    • Aug
    • M.D. Godfrey, "CMOS Device Modeling for Subthreshold Circuits", IEEE Transactions on Circuits and Systems, Vol. 39,Aug 1992, pp.532-539.
    • (1992) IEEE Transactions on Circuits and Systems , vol.39 , pp. 532-539
    • Godfrey, M.D.1
  • 6
    • 0000239119 scopus 로고    scopus 로고
    • The Challenge of Signal Integrity in Deep-Submicronmeter CMOS Technology
    • April
    • F. Caiget, S. Delamas-Bendhia and, E. Sicard, "The Challenge of Signal Integrity in Deep-Submicronmeter CMOS Technology", IEEE Proceedings, Vol. 89, April 200, pp.556-573.
    • IEEE Proceedings , vol.89 , Issue.200 , pp. 556-573
    • Caiget, F.1    Delamas-Bendhia, S.2    Sicard, E.3
  • 7
    • 15244352750 scopus 로고    scopus 로고
    • Capacitive Coupling Noise in High-Speed VLSI Circuits
    • P. Heydari and, M. Pedram, "Capacitive Coupling Noise in High-Speed VLSI Circuits", IEEE Transactions CAD, Vol.24, 2005.
    • (2005) IEEE Transactions CAD , vol.24
    • Heydari, P.1    Pedram, M.2
  • 8
    • 0027222295 scopus 로고
    • Closed-Form Expressions for Interconnect Delay, Coupling, and Crosstalk in VLSI's
    • Jan
    • T. Sakurai, "Closed-Form Expressions for Interconnect Delay, Coupling, and Crosstalk in VLSI's", IEEE Transactions on Electron Devices, Jan 1993, pp. 118-124.
    • (1993) IEEE Transactions on Electron Devices , pp. 118-124
    • Sakurai, T.1
  • 9
    • 0032681122 scopus 로고    scopus 로고
    • Harmony: Static Noise Analysis of Deep Submicron Digital Integrated Circuits
    • K.L. Shepard, "Harmony: Static Noise Analysis of Deep Submicron Digital Integrated Circuits", Transactions IEEE CAD. Vol.18, 1999.
    • (1999) Transactions IEEE CAD , vol.18
    • Shepard, K.L.1
  • 10
    • 0033685443 scopus 로고    scopus 로고
    • ClariNet: A Noise analysis tool for deep submicron design
    • R. Levy, et.al., "ClariNet: A Noise analysis tool for deep submicron design", DAC, 2000, pp. 233-238.
    • (2000) DAC , pp. 233-238
    • Levy, R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.