Robust design of high fan-in/out subthreshold circuits

Proceedings - IEEE International Conference on Computer Design: VLSI in Computers and Processors

Volumn 2005, Issue , 2005, Pages 405-410

  Chen, Jinhui ^a   Clark, Lawrence T ^a   Cao, Yu ^a  

^a Arizona State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CIRCUIT FAILURES; FAN-OUT CIRCUITS; POWER SUPPLIES; ULTRA-LOW POWER SYSTEMS;

COMPUTER SIMULATION; CURRENT VOLTAGE CHARACTERISTICS; DATA STORAGE EQUIPMENT; LOGIC DESIGN; MATHEMATICAL MODELS; ROBUSTNESS (CONTROL SYSTEMS); SPURIOUS SIGNAL NOISE; THRESHOLD VOLTAGE; TRANSISTORS;

DIGITAL INTEGRATED CIRCUITS;

EID: 33747042922     PISSN: 10636404     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICCD.2005.96     Document Type: Conference Paper

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