Variation analysis of CAM cells

Proceedings - Eighth International Symposium on Quality Electronic Design, ISQED 2007

Volumn , Issue , 2007, Pages 333-338

  Mupid, Amol ^a   Mutyam, Madhu ^b   Vijaykrishnan, N ^a   Xie, Y ^a   Irwin, M J ^a  

^a The Pennsylvania State University   (United States)

^b INTERNATIONAL INSTITUTE OF INFORMATION TECHNOLOGY   (India)

Author keywords

[No Author keywords available]

Indexed keywords

DATA STRUCTURES; FAILURE ANALYSIS; MICROPROCESSOR CHIPS; NETWORK ARCHITECTURE;

ARCHITECTURAL TECHNIQUES; CAM STRUCTURES; SUPPLY VOLTAGE; SUPPLY VOLTAGE CHANGES;

ASSOCIATIVE STORAGE;

EID: 34548118600     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISQED.2007.166     Document Type: Conference Paper

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