Fowler-nordheim tunneling in electromigrated break junctions with porphyrin molecules

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 46, Issue 4 B, 2007, Pages 2683-2686

  Noguchi, Yutaka ^a   Nagase, Takashi ^a,b   Ueda, Rieko ^a   Kamikado, Toshiya ^a   Kubota, Tohru ^a   Mashiko, Shinro ^a  

^a NATIONAL INSTITUTE OF INFORMATION AND COMMUNICATIONS TECHNOLOGY   (Japan)

^b Osaka Prefecture University   (Japan)

Author keywords

Fowler Nordhelm tunneling; Molecular junction; Nanogap electrode; Porphyrin

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; ELECTROCHEMICAL ELECTRODES; ELECTROMIGRATION; FERMI LEVEL; FIELD EMISSION; PORPHYRINS;

MOLECULAR JUNCTIONS; TETRAPHENYLPORPHYRIN DERIVATIVE; TUNNELING BARRIER;

SEMICONDUCTOR JUNCTIONS;

EID: 34547862114     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.46.2683     Document Type: Article

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