Fabrication of Au-molecule-Au junctions using electromigration method

Thin Solid Films

Volumn 499, Issue 1-2, 2006, Pages 90-94

  Noguchi, Yutaka ^a   Nagase, Takashi ^a   Kubota, Tohru ^a   Kamikado, Toshiya ^a   Mashiko, Shinro ^a  

^a NATIONAL INSTITUTE OF INFORMATION AND COMMUNICATIONS TECHNOLOGY   (Japan)

Author keywords

Coulomb staircase; Electromigration; Molecular electronics; Porphyrin

Indexed keywords

ALUMINUM; ELECTRIC POTENTIAL; ELECTRODES; ELECTROMIGRATION; ELECTRONIC DENSITY OF STATES; GOLD; PORPHYRINS; SELF ASSEMBLY; SOLVENTS;

COULOMB STAIRCASE; GATE BIAS VOLTAGE; MOLECULAR ELECTRONICS; MOLECULAR JUNCTIONS;

MOLECULAR DYNAMICS;

EID: 31544467055     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2005.06.078     Document Type: Conference Paper

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