Noise modeling in lateral nonuniform MOSFET

IEEE Transactions on Electron Devices

Volumn 54, Issue 8, 2007, Pages 1994-2001

  Roy, Ananda S ^a   Enz, Christian C ^b   Sallese, Jean Michel ^a  

^a EPFL   (Switzerland)

^b CSEM   (Switzerland)

Author keywords

Flicker noise; Impedance field; Induced gate noise; Lateral non uniform doping; Mobility degradation; MOSFET; Noise modeling; Thermal noise

Indexed keywords

CARRIER MOBILITY; ELECTRIC IMPEDANCE; SEMICONDUCTOR DOPING; THERMAL NOISE;

FLICKER NOISE; INDUCED GATE NOISE; KLAASSEN-PRINS (KP)-BASED METHODS; LATERAL NON-UNIFORM DOPING;

MOSFET DEVICES;

EID: 34547857367     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2007.901146     Document Type: Article

References (15)

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