SCOPUS 정보 검색 플랫폼 - 논문 보기

메뉴 건너뛰기

Journal of Applied Physics

Volumn 101, Issue 12, 2007, Pages

Carrier transport through a dry-etched InP-based two-dimensional photonic crystal

(5) Berrier, A a Mulot, M a,b Malm, G a Ostling M a Anand, S a

a ROYAL INSTITUTE OF TECHNOLOGY (Sweden)

b AALTO UNIVERSITY (Finland)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER TRANSPORT; CURRENT VOLTAGE CHARACTERISTICS; ETCHING; INDIUM PHOSPHIDE; ION BEAMS; LATTICE CONSTANTS;

ION BEAM ETCHING; LATTICE PERIOD; SIMULATED CONDUCTANCE; TWO-DIMENSIONAL PHOTONIC CRYSTALS;

PHOTONIC CRYSTALS;

EID: 34547493266 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.2747222 Document Type: Article

Times cited : (27)

References (27)

1
- 1542375034
- 0003-6951 10.1063/1.1645675
- B. Wild, R. Ferrini, R. Houdŕ, M. Mulot, S. Anand, and C. J. M. Smith, Appl. Phys. Lett. 0003-6951 10.1063/1.1645675 84, 846 (2004).
- (2004) Appl. Phys. Lett. , vol.84 , pp. 846
- Wild, B.¹ Ferrini, R.² Houdŕ, R.³ Mulot, M.⁴ Anand, S.⁵ Smith, C.J.M.⁶

2
- 0142185488
- 0013-5194 10.1049/el:20030930
- T. Baba, M. Shiga, K. Inoshita, and F. Koyama, Electron. Lett. 0013-5194 10.1049/el:20030930 39, 1516 (2003).
- (2003) Electron. Lett. , vol.39 , pp. 1516
- Baba, T.¹ Shiga, M.² Inoshita, K.³ Koyama, F.⁴

3
- 27744523787
- 0028-0836 10.1038/nature04210
- Y. A. Vlasov, M. O'Boyle, H. F. Hamann, and S. J. McNab, Nature 0028-0836 10.1038/nature04210 438, 65 (2005).
- (2005) Nature , vol.438 , pp. 65
- Vlasov, Y.A.¹ O'Boyle, M.² Hamann, H.F.³ McNab, S.J.⁴

4
- 4444314960
- 0036-8075 10.1126/science.1100968
- H. -G. Park, S. -H. Kim, S. -H. Kwon, Y. -G. Ju, J. -K. Yang, J. -H. Baek, S. -B. Kim, and Y. -H. Lee, Science 0036-8075 10.1126/science.1100968 305, 1444 (2004).
- (2004) Science , vol.305 , pp. 1444
- Park, H.-G.¹ Kim, S.-H.² Kwon, S.-H.³ Ju, Y.-G.⁴ Yang, J-K.⁵ Baek, J.-H.⁶ Kim, S.-B.⁷ Lee, Y.-H.⁸

5
- 18144427898
- 0733-8724 10.1109/JLT.2005.843469
- S. de Rossi, I. Sagnes, L. Legratiet, A. Talneau, A. Berrier, M. Mulot, S. Anand, and J. -L. Gentner, J. Lightwave Technol. 0733-8724 10.1109/JLT.2005.843469 23, 1363 (2005).
- (2005) J. Lightwave Technol. , vol.23 , pp. 1363
- De Rossi, S.¹ Sagnes, I.² Legratiet, L.³ Talneau, A.⁴ Berrier, A.⁵ Mulot, M.⁶ Anand, S.⁷ Gentner, J.-L.⁸

6
- 33751040603
- 0277-786X
- A. Berrier, M. Mulot, G. Malm, M. Östling, and S. Anand, Proc. SPIE 6322, 63220J (2006). 0277-786X
- (2006) Proc. SPIE , vol.6322
- Berrier, A.¹ Mulot, M.² Malm, G.³ Östling, M.⁴ Anand, S.⁵

7
- 21544481683
- 0003-6951 10.1063/1.101327
- B. E. Maile, A. Forchel, R. Germann, and D. Grützmacher, Appl. Phys. Lett. 0003-6951 10.1063/1.101327 54, 1552 (1989).
- (1989) Appl. Phys. Lett. , vol.54 , pp. 1552
- Maile, B.E.¹ Forchel, A.² Germann, R.³ Grützmacher, D.⁴

8
- 0010613549
- 0268-1242 10.1088/0268-1242/12/6/019
- H. Iber, S. Mo, E. Peiner, G. Vollrath, A. Schlacetzki, and F. Fiedler, Semicond. Sci. Technol. 0268-1242 10.1088/0268-1242/12/6/019 12, 755 (1997).
- (1997) Semicond. Sci. Technol. , vol.12 , pp. 755
- Iber, H.¹ Mo, S.² Peiner, E.³ Vollrath, G.⁴ Schlacetzki, A.⁵ Fiedler, F.⁶

9
- 0003895935
- 0021-4922 10.1143/JJAP.37.3576
- T. Tamura, T. Ando, N. Nunoya, S. Tamura, S. Arai, and G. U. Bacher, Jpn. J. Appl. Phys., Part 1 0021-4922 10.1143/JJAP.37.3576 37, 3576 (1998).
- (1998) Jpn. J. Appl. Phys., Part 1 , vol.37 , pp. 3576
- Tamura, T.¹ Ando, T.² Nunoya, N.³ Tamura, S.⁴ Arai, S.⁵ Bacher, G.U.⁶

10
- 0035441548
- 1071-1023 10.1116/1.1403440
- C. F. Carlström and S. Anand, J. Vac. Sci. Technol. B 1071-1023 10.1116/1.1403440 19, 1905 (2001).
- (2001) J. Vac. Sci. Technol. B , vol.19 , pp. 1905
- Carlström, C.F.¹ Anand, S.²

11
- 0000691827
- 1071-1023 10.1116/1.589700
- E. W. Berg and S. W. Pang, J. Vac. Sci. Technol. B 1071-1023 10.1116/1.589700 15, 2643 (1997).
- (1997) J. Vac. Sci. Technol. B , vol.15 , pp. 2643
- Berg, E.W.¹ Pang, S.W.²

12
- 21544449964
- 0003-6951 10.1063/1.103003
- G. Mayer, B. E. Maile, R. Germann, A. Forchel, P. Grambow, and H. P. Meier, Appl. Phys. Lett. 0003-6951 10.1063/1.103003 56, 2016 (1990).
- (1990) Appl. Phys. Lett. , vol.56 , pp. 2016
- Mayer, G.¹ Maile, B.E.² Germann, R.³ Forchel, A.⁴ Grambow, P.⁵ Meier, H.P.⁶

13
- 0001229011
- 1071-1023 10.1116/1.587619
- C. Youtsey, R. Grundbacher, R. Panepucci, I. Adesida, and C. Caneau, J. Vac. Sci. Technol. B 1071-1023 10.1116/1.587619 12, 3317 (1994).
- (1994) J. Vac. Sci. Technol. B , vol.12 , pp. 3317
- Youtsey, C.¹ Grundbacher, R.² Panepucci, R.³ Adesida, I.⁴ Caneau, C.⁵

14
- 0042879662
- 0003-6951 10.1063/1.1598647
- A. D. Bristow, J. -P. R. Wells, W. H. Fan, A. M. Fox, M. S. Skolnick, D. M. Whittaker, A. Tahraoui, T. Krauss, and J. S. Roberts, Appl. Phys. Lett. 0003-6951 10.1063/1.1598647 83, 851 (2003).
- (2003) Appl. Phys. Lett. , vol.83 , pp. 851
- Bristow, A.D.¹ Wells, -P.J.R.² Fan, W.H.³ Fox, A.M.⁴ Skolnick, M.S.⁵ Whittaker, D.M.⁶ Tahraoui, A.⁷ Krauss, T.⁸ Roberts, J.S.⁹

15
- 33646706124
- 0003-6951 10.1063/1.2191955
- P. Murzyn, A. Z. Garcia-Deniz, D. O. Kundys, A. M. Fox, J. -P. R. Wells, D. M. Whittaker, M. S. Skolnick, T. F. Krauss, and J. S. Roberts, Appl. Phys. Lett. 0003-6951 10.1063/1.2191955 88, 141104 (2006).
- (2006) Appl. Phys. Lett. , vol.88 , pp. 141104
- Murzyn, P.¹ Garcia-Deniz, A.Z.² Kundys, D.O.³ Fox, A.M.⁴ Wells, -P.J.R.⁵ Whittaker, D.M.⁶ Skolnick, M.S.⁷ Krauss, T.F.⁸ Roberts, J.S.⁹

16
- 2342466114
- 1071-1023 10.1116/1.1688353
- M. Mulot, S. Anand, R. Ferrini, B. Wild, R. Houdŕ, J. Moosburger, and A. Forchel, J. Vac. Sci. Technol. B 1071-1023 10.1116/1.1688353 22, 707 (2004).
- (2004) J. Vac. Sci. Technol. B , vol.22 , pp. 707
- Mulot, M.¹ Anand, S.² Ferrini, R.³ Wild, B.⁴ Houdŕ, R.⁵ Moosburger, J.⁶ Forchel, A.⁷

17
- 4944245125
- 1071-1023 10.1116/1.1767106
- M. V. Kotlyar, L. O'Faolain, R. Wilson, and T. Krauss, J. Vac. Sci. Technol. B 1071-1023 10.1116/1.1767106 22, 1788 (2004).
- (2004) J. Vac. Sci. Technol. B , vol.22 , pp. 1788
- Kotlyar, M.V.¹ O'Faolain, L.² Wilson, R.³ Krauss, T.⁴

18
- 34047147995
- 1071-1023 10.1116/1.2402142
- A. Berrier, M. Mulot, S. Anand, A. Talneau, R. Ferrini, and R. Houdŕ, J. Vac. Sci. Technol. B 1071-1023 10.1116/1.2402142 25, 1 (2007).
- (2007) J. Vac. Sci. Technol. B , vol.25 , pp. 1
- Berrier, A.¹ Mulot, M.² Anand, S.³ Talneau, A.⁴ Ferrini, R.⁵ Houdŕ, R.⁶

19
- 17344384323
- K. Avary, J. P. Reithmaier, F. Klopf, T. Happ, M. Kamp, and A. Forchel, Microelectron. Eng. 61-62, 875 (2002).
- (2002) Microelectron. Eng. , vol.61-62 , pp. 875
- Avary, K.¹ Reithmaier, J.P.² Klopf, F.³ Happ, T.⁴ Kamp, M.⁵ Forchel, A.⁶

20
- 0005230288
- 0021-8979 10.1063/1.365806
- P. J. Corvini and J. E. Bowers, J. Appl. Phys. 0021-8979 10.1063/1.365806 82, 259 (1997).
- (1997) J. Appl. Phys. , vol.82 , pp. 259
- Corvini, P.J.¹ Bowers, J.E.²

21
- 33751033527
- 0022-5355
- D. L. Lile and D. A. Collins, J. Vac. Sci. Technol. 13, 868 (1976). 0022-5355
- (1976) J. Vac. Sci. Technol. , vol.13 , pp. 868
- Lile, D.L.¹ Collins, D.A.²

22
- 34547484893
- 0081-1947
- B. R. Nag and G. M. Dutta, J. Phys C 11, 119 (1977). 0081-1947
- (1977) J. Phys C , vol.11 , pp. 119
- Nag, B.R.¹ Dutta, G.M.²

23
- 34547410357
- ISE TCAD 9.5.3, 2003, www.ise.com.
- (2003)

24
- 0001229011
- 1071-1023 10.1116/1.587619
- C. Youtsey, R. Grundbacher, R. Panepucci, I. Adesida, and C. Caneau, J. Vac. Sci. Technol. B 1071-1023 10.1116/1.587619 12, 3317 (1994).
- (1994) J. Vac. Sci. Technol. B , vol.12 , pp. 3317
- Youtsey, C.¹ Grundbacher, R.² Panepucci, R.³ Adesida, I.⁴ Caneau, C.⁵

25
- 0018520371
- 0022-5355 10.1116/1.570214
- R. H. Williams, R. R. Varma, and V. Montgomery, J. Vac. Sci. Technol. 0022-5355 10.1116/1.570214 16, 1418 (1979).
- (1979) J. Vac. Sci. Technol. , vol.16 , pp. 1418
- Williams, R.H.¹ Varma, R.R.² Montgomery, V.³

26
- 0019058555
- 0022-5355 10.1116/1.570583
- W. E. Spicer, I. Lindau, P. Skeath, and C. Y. Yu, J. Vac. Sci. Technol. 0022-5355 10.1116/1.570583 17, 1019 (1980).
- (1980) J. Vac. Sci. Technol. , vol.17 , pp. 1019
- Spicer, W.E.¹ Lindau, I.² Skeath, P.³ Yu, C.Y.⁴

27
- 0019534366
- 0022-5355 10.1116/1.571620
- J. D. Dow and R. E. Allen, J. Vac. Sci. Technol. 0022-5355 10.1116/1.571620 20, 659 (1982).
- (1982) J. Vac. Sci. Technol. , vol.20 , pp. 659
- Dow, J.D.¹ Allen, R.E.²

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.