Observation of ultrahigh density InGaN quantum dots

Journal of Applied Physics

Volumn 102, Issue 1, 2007, Pages

  Tsai, H L ^a   Wang, T Y ^a   Yang, J R ^a   Wang, T C ^b   Hsu, J T ^b   Shiojiri, M ^c,d  

^a NATIONAL TAIWAN UNIVERSITY   (Taiwan)

^b INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE   (Taiwan)

^c KANAZAWA MEDICAL UNIVERSITY   (Japan)

^d NONE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ENERGY DISPERSIVE SPECTROSCOPY; ENERGY DISPERSIVE X RAY ANALYSIS; GALLIUM NITRIDE; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; MASKS; NANOCRYSTALS; SEMICONDUCTING INDIUM COMPOUNDS; THICKNESS MEASUREMENT;

BRIGHT TRIANGLES; ENERGY DISPERSIVE X-RAY SPECTROSCOPY; NANOMETERS; ULTRAHIGH DENSITY;

SEMICONDUCTOR QUANTUM DOTS;

EID: 34547230195     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2745848     Document Type: Article

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