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Volumn 91, Issue 2, 2007, Pages

Effects of chlorine residue in atomic layer deposition hafnium oxide: A density-functional-theory study

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC LAYER DEPOSITION; CHLORINE; DENSITY FUNCTIONAL THEORY; ENERGY GAP; VALENCE BANDS;

EID: 34547213272     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2756108     Document Type: Article
Times cited : (10)

References (20)
  • 2
    • 34547206087 scopus 로고    scopus 로고
    • International Technology Roadmafor Semiconductors, Semiconductor Industry Association, 2005. See Table 66 for new gate stack processes and materials.
    • International Technology Roadmap for Semiconductors, Semiconductor Industry Association, 2005. See Table 66 for new gate stack processes and materials.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.