Application of the electron channeling contrast imaging technique to the study of dislocations associated with cracks in bulk specimens

Ultramicroscopy

Volumn 75, Issue 3, 1998, Pages 137-145

  Ng, B C ^a   Simkin, B A ^a   Crimp, M A ^a  

^a Michigan State University   (United States)

Author keywords

Electron diffraction; In situ specimen treatment; Scanning electron microscopy

Indexed keywords

DISLOCATIONS (CRYSTALS); ELECTRON DIFFRACTION; SCANNING ELECTRON MICROSCOPY; SINGLE CRYSTALS; TRANSMISSION ELECTRON MICROSCOPY;

ELECTRON CHANNELING CONTRAST IMAGING TECHNIQUE; IN SITU SPECIMEN TREATMENT;

IMAGING TECHNIQUES;

ALUMINUM DERIVATIVE;

ARTICLE; CRYSTAL; ELECTRON DIFFRACTION; IMAGING SYSTEM; SCANNING ELECTRON MICROSCOPY; SURFACE PROPERTY;

EID: 0032442758     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(98)00057-6     Document Type: Article

References (17)

1. P. Dang, M. Grujicic, Acta Mater. 45 (1) (1997) 75.
2. S.M. Ohr, Mater. Sci. Eng. 72 (1985) 1.
3. I. Baker, J.A. Horton, Phil. Mag. A 67 (2) (1993) 479.
4. B. Ghosh, M.A. Crimp, in: W.O. Soboyejo, T.S. Srivatsan, H.L. Fraser (Eds.), Deformation and Fracture of Ordered Intermetallic Materials III, The Minerals, Metals and Materials Society, 1996, p. 349.
5. P. Morin, M. Pitaval, D. Besnard, G. Fontaine, Phil. Mag. A 40 (1979) 511.
6. J.T. Czernuszka, N.J. Long, E.D. Boyes, P.B. Hirsch, Mater. Res. Soc. Symp. Proc. 209 (1991) 289.
7. B.A. Simkin, M.A. Crimp, in: G.W. Balley, J.M. Corbett, R.V.W. Dimlich, J.R. Michael, N.J. Zaluzec (Eds.), Proc. Microscopy and Microanalysis 1996, Minneapolis, Minnesota, 11-15 August 1996, pp. 140-141.
8. J.P. Spencer, C.J. Humphreys, P.B. Hirsch, Phil. Mag. 26 (1972) 193.
9. D.C. Joy, Mater. Res. Soc. Symp. Proc. 183 (1990) 199.
10. J.T. Czernuszka, N.J. Long, P.B. Hirsch, Inst. Phys. Conf. Ser. No. 117: Section 10, Microsc. Semicond. Mater. Conf., Oxford, 25-28 March 1991, pp. 771-773.
11. A.J. Wilkinson, G.R. Anstist, J.T. Czernuszka, N.J. Long, P.B. Hirsch, Phil. Mag. A. 68 (1) (1993) 59.
12. D.E. Newbury, D.C. Joy, P. Echlin, C.E. Fiori, J.I. Goldstein, Advanced Scanning Electron Microscopy and X-ray Microanalysis, Plenum Press, New York, 1986.
13. B.A. Simkin, M.A. Crimp, Ultramicroscopy, submitted.
14. D. Pope, R. Darolia, MRS Bull. (1996) 30.
15. D.B. Miracle, Acta Mater. 41 (3) (1993) 649.
16. A.J. Duncan, M.J. Kaufman, J.H. Schneibel, Scr. Metall. Mater. 31 (1) (1994) 105.
17. P.B. Hirsch, A. Howie, R. Nicholson, D.W. Pashley, M.J. Whelan, Electron Microscopy of Thin Crystals, Robert E. Krieger Publishing Co., Inc., 1977, p. 274.