Study of dislocation structures near fatigue cracks using electron channelling contrast imaging technique (ECCI)

Journal of Microscopy

Volumn 195, Issue 3, 1999, Pages 197-203

  Ahmed, J ^a   Wilkinson, A J ^a   Roberts, S G ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

Crack; Dislocation; EBSD; ECCI; ECP; Extrusion; Fatigue; Intrusion; PSB; TEM

Indexed keywords

BACKSCATTERING; CRACK TIPS; DISLOCATIONS (CRYSTALS); ELECTRON DIFFRACTION; ELECTRONS; FATIGUE CRACK PROPAGATION; SCANNING ELECTRON MICROSCOPY; SINGLE CRYSTALS;

DISLOCATION; DISLOCATION STRUCTURES; EBSD; ECP; ELECTRON CHANNELING CONTRAST IMAGING TECHNIQUE; ELECTRON CHANNELLING CONTRAST IMAGING; FATIGUE CRACKS; INTRUSION; PSB; TEM;

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;

ARTICLE; CONTRAST ENHANCEMENT; CRYSTALLOGRAPHY; DISLOCATION; ELECTRON DIFFRACTION; IMAGE ANALYSIS; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0032876426     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.1999.00574.x     Document Type: Article

References (12)

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