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Volumn 140, Issue 1-2, 2007, Pages 64-68

Target poisoning during reactive sputtering of silicon with oxygen and nitrogen

Author keywords

Reactive sputtering; Silicon nitride; Silicon oxide; XPS

Indexed keywords

CHEMICAL BONDS; HYSTERESIS; REACTIVE SPUTTERING; SILICA; SILICON NITRIDE; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 34250663896     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mseb.2007.04.001     Document Type: Article
Times cited : (17)

References (23)
  • 18
    • 85166057170 scopus 로고    scopus 로고
    • http://www.glow-discharge.com/secondary_electron_yield.htm.
  • 22
    • 85166163780 scopus 로고    scopus 로고
    • http://www.azom.com/details.asp?ArticleID=1114.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.