3-D X-ray diffraction imaging with nanoscale resolution using incoherent radiation

Nano Letters

Volumn 7, Issue 5, 2007, Pages 1246-1250

  Nikulin, Andrei Y ^a   Dilanian, Ruben A ^a   Zatsepin, Nadia A ^a   Gable, Brian M ^a   Muddle, Barry C ^a   Souvorov, Alexei Y ^b   Nishino, Yoshinori ^c   Ishikawa, Tetsuya ^c  

^a MONASH UNIVERSITY   (Australia)

^b SPring 8/JASRI ^*  (Japan)

^c SPring 8/RIKEN ^*  (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DATA REDUCTION; ELEMENTARY PARTICLES; IMAGE ANALYSIS; IMAGE RECONSTRUCTION; THREE DIMENSIONAL COMPUTER GRAPHICS; X RAY DIFFRACTION ANALYSIS;

3-D X-RAY DIFFRACTION IMAGING; COMPOSITE NANOSTRUCTURES; INCOHERENT RADIATION;

NANOSTRUCTURED MATERIALS;

EID: 34249657857     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl070131z     Document Type: Article

References (30)

1. Embury, J. D.; C. W. Sinclair, C. W. Mater. Sci. Eng. 2001, A319-21, 37-45.
2. Williams, D. B.; Carter, C. B. Transmission Electron Microscopy, Part I-Basics; Plenum Press: New York and London, 1996; pp 1-173.
3. Miller, M. K. Atom Probe Tomography-Analysis at the Atomic Level; Kluwer Academic/Plenum: Dordrecht, The Netherlands, 2000.
4. Renaud, G.; Lazzari, R.; Revenant, C.; Barbier, A.; Noblet, M.; Ulrich, O.; Leroy, F.; Jupille, J.; Borensztein, Y.; Henry, C. R.: Deville, J.; Scheurer, F.; Mane-Mane, J.; Fruchart, O. Science 2003, 300, 1416-1419.
5. Fienup, J. R. Appl. Opt. 1982, 21, 2758-2769.
6. Miao, J.; Charalambous, P.; Sayre, D. Nature (London) 1999, 400, 342-344.
7. Robinson, I. K.; Vartanyants, I. A.; Williams, G. J.; Pfeifer, M. A.; Pitney, J. A. Phys. Rev. Lett. 2001, 87, 195505(4).
8. Miao, J.; Ishikawa, T.; Johnson, B.; Anderson, E. H.; Lai, B.; Hodgson, K. Phys. Rev. Lett. 2002, 89, 088303(4).
9. Williams, G. J.; Pfeifer, M. A.; Vartanyants, I. A.; Robinson, I. K. Phys. Rev. Lett. 2003, 90, 175501(4).
10. He, H.; Marchesini, S.; Howells, M. R.; Weierstall, U.; Chapman, H. N.; Hau-Riege, S. P.; Noy, A.; Spence, J. C. H. Phys. Rev. B 2003, 67, 174114(3).
11. Marchesini, S.; He, H.; Chapman, H. N.; Hau-Riege, S. P.; Noy, A.; Howells, M. R.; Weierstall, U.; Spence, J. C. H. Phys. Rev. B 2003, 68, 140101(4).
12. Nugent, K. A.; Peele, A. G.; Chapman, H. N.; Mancuso, A. P. Phys. Rev. Lett. 2003, 91, 203902(4).
13. Eisebitt, S.; Lörgen, M.; Eberhardt, W.; Lüning, J.; Andrews, S.; Stöhr, J. Nature (London) 2004, 432, 885-888.
14. McBride, W.; O'Leary, N. L.; Allen, L. J. Phys. Rev. Lett. 2004, 93, 233902(4).
15. van der Veen, F.; Pfeiffer, F. J. Phys.: Condens. Matter. 2004, 16, 5003-5030.
16. Miao, J.; Nishino, Y.; Kohmura, Y.; Johnson, B.; Song, C.; Risbud, S. H.; Ishikawa, T. Phys. Rev. Lett. 2005, 95, 085503(4).
17. Pfeifer, M. A.; Williams, G. J.; Vartanyants, I. A.; Harder, R.; Robinson, I. K. Nature (London) 2006, 442, 63-66.
18. Jacobsen, C.; Kirz, J. Nature Struct. Biol. 1998, 5, 650-653.
19. Larson, B. C.; Yang, W.; Ice, G. E.; Budai, J. D.; Tischler, J. Z. Nature 2002, 415, 887-890.
20. Chao, W.; Harteneck, B. D.; Liddle, J. A.; Andersen, E. H.; Attwood, D. T. Nature (London) 2005, 435, 1210-1213.
21. Schroer, C. G.; Kurapova, O.; Patommel, J.; Boye, P.; Feldkamp, J.; Lengeler, B.; Burghammer, M.; Riekel, C.; Vincze, L.; van der Hart, A.; Kühler, M. Appl. Phys. Lett. 2005, 87, 124103(3).
22. Maser, J.; et al. Proc. 8th Int. Conf. X-ray Microscopy, IPAP Conf. Ser. 7; 2005, 26-29.
23. Zuo, J. M.; Vartanyants, I. A.; Gao, M.; Zhang, R.; Nagahara, L. A. Science 2003, 300, 1419-1421.
24. Faulkner, H. M.; Rodenburg, J. M. Phys. Rev. Lett. 2004, 93, 023903(4).
25. Wu, J. S.; Weierstall, U.; Spence, J. C. H. Nat. Mater. 2005, 4, 912-916.
26. Nikulin, A. Y.; Sakata, O.; Hashizume, H.; Petrashen, P. V. J. Appl. Cryst. 1994, 27, 338-344.
27. Nikulin, A. Y.; Davis, J. R.; Cookson, D. J. Phys. Stat. Sol. a 1998, 169, 3-8.
28. Dilanian, R. A.; Nikulin, A. Y. Appl. Phys. Lett. 2005, 87. 161904(3).
29. Gayle, F. W.; Goodway, M. Science 1994, 266, 1015-1017.
30. Nikulin, A. Y.; Darahanau, A. V.; Horney, R. B.; Ishikawa, T. Physica B 2004, 349, 281-295.