Fabrication and characterization of microlens arrays using a cantilever-based spotter

Optics Express

Volumn 15, Issue 11, 2007, Pages 6900-6907

  Bardinal, V ^a   Daran, E ^a   Leichle T ^a   Vergnenegre C ^a   Levallois, C ^a   Camps, T ^a   Conedera, V ^a   Doucet, J B ^a   Carcenac, F ^a   Ottevaere, H ^b   Thienpont, H ^b  

^a LAAS CNRS   (France)

^b VRIJE UNIVERSITEIT BRUSSEL   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

ABERRATIONS; ATOMIC FORCE MICROSCOPY; MACH-ZEHNDER INTERFEROMETERS; ORGANIC POLYMERS; SCANNING ELECTRON MICROSCOPY; SURFACE ROUGHNESS;

MICROLENS ARRAYS; OPTICAL QUALITY; ROOT MEAN SQUARE ABERRATION;

MICROLENSES;

EID: 34249650224     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.15.006900     Document Type: Article

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