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Volumn , Issue , 2006, Pages 730-733

A closed-loop MEMS-based spotter integrating position sensors with nanometric precision for the control of droplet uniformity

Author keywords

Closed loop system; Microcantilevers; Picoliter droplet deposition; Piezoresistive sensors

Indexed keywords

BIOASSAY; BIOCHIPS; COMPOSITE MICROMECHANICS; DROP FORMATION; DROPS; MEMS; MICROARRAYS; MICROELECTROMECHANICAL DEVICES; MOLECULES; NEMS; NUCLEIC ACIDS; OPTICAL DESIGN; ORGANIC ACIDS; PHOTORESISTS;

EID: 46149113932     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/NEMS.2006.334883     Document Type: Conference Paper
Times cited : (10)

References (6)
  • 2
    • 46149124146 scopus 로고    scopus 로고
    • TeleChem International, Inc
    • TeleChem International, Inc. http://arrayit.com.
  • 3
    • 0037818303 scopus 로고    scopus 로고
    • A silicon-micromachined pin for contact droplet printing
    • J. G. F. Tsai, Z. Chen, S. Nelson, C.-J. Kim, "A silicon-micromachined pin for contact droplet printing," Proc. IEEE MEMS 2003, pp. 295-298.
    • (2003) Proc. IEEE MEMS , pp. 295-298
    • Tsai, J.G.F.1    Chen, Z.2    Nelson, S.3    Kim, C.-J.4
  • 5
    • 27544453418 scopus 로고    scopus 로고
    • First step towards a fully automated trim control for liquid deposition device at the microscale using piezoresistive cantilevers row
    • P. Belaubre, J.-B. Pourciel, D. Saya, T. Leïchlé, F. Mathieu, L. Nicu, and C. Bergaud, "First step towards a fully automated trim control for liquid deposition device at the microscale using piezoresistive cantilevers row," Proc. Transducers '05, pp. 648-651.
    • Proc. Transducers '05 , pp. 648-651
    • Belaubre, P.1    Pourciel, J.-B.2    Saya, D.3    Leïchlé, T.4    Mathieu, F.5    Nicu, L.6    Bergaud, C.7
  • 6
    • 14744294291 scopus 로고    scopus 로고
    • SDAPPLIN, a method for 2D profiling on high aspect-ratio microstructures: Improvement for 3D surfacing
    • Hiroshima, Japan, July
    • J.-B. Pourciel, L. Jalabert, and T. Masuzawa, "SDAPPLIN, a method for 2D profiling on high aspect-ratio microstructures: Improvement for 3D surfacing," Japan-USA Symposium on Flexible Automation, Hiroshima, Japan, July 2002, vol. 1, pp. 553-559.
    • (2002) Japan-USA Symposium on Flexible Automation , vol.1 , pp. 553-559
    • Pourciel, J.-B.1    Jalabert, L.2    Masuzawa, T.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.