-
1
-
-
84975606588
-
-
I. Richer, P. Sun, F, Xu, and Y. Fainman, Appl. Optics 34 2421 (1995).
-
(1995)
Appl. Optics
, vol.34
, pp. 2421
-
-
Richer, I.1
Sun, P.2
Xu, F.3
Fainman, Y.4
-
3
-
-
1242329865
-
-
T. N. Oder, K.H. Kim, J. Y. Lin, and H. X. Jiang Appl Phys. Lett. 84, 466 (2004).
-
(2004)
Appl Phys. Lett
, vol.84
, pp. 466
-
-
Oder, T.N.1
Kim, K.H.2
Lin, J.Y.3
Jiang, H.X.4
-
5
-
-
0038582747
-
-
H.-Y. Ryu, J.-K. Hwang, Y.-J. Lee, and Y.-H. Lee, IEEE J. Sel. Top. Quantum Electron. 8, 238 (2002).
-
(2002)
IEEE J. Sel. Top. Quantum Electron
, vol.8
, pp. 238
-
-
Ryu, H.-Y.1
Hwang, J.-K.2
Lee, Y.-J.3
Lee, Y.-H.4
-
7
-
-
0042926609
-
-
T. N. Oder, J. Shakya, J. Y. Lin, and H. X. Jiang, Appl. Phys. Lett. 83, 1231(2003).
-
(2003)
Appl. Phys. Lett
, vol.83
, pp. 1231
-
-
Oder, T.N.1
Shakya, J.2
Lin, J.Y.3
Jiang, H.X.4
-
9
-
-
23444436105
-
-
S.W. Ahn, K.D. Lee, J.S. Kim, S.H. Kim, J.D. Park, S.H. Lee, and P.W. Yoon, Nanotechnology 16, 1874 (2005).
-
(2005)
Nanotechnology
, vol.16
, pp. 1874
-
-
Ahn, S.W.1
Lee, K.D.2
Kim, J.S.3
Kim, S.H.4
Park, J.D.5
Lee, S.H.6
Yoon, P.W.7
-
10
-
-
31744450188
-
-
J. Wang, P. Sciortino, F. Liu, P. Yuan, X. Deng, F. Walters, X. Liu, J. Bacon, and L. Chen, Proc. SPIE 5931, 59310D(2005).
-
(2005)
Proc. SPIE
, vol.5931
-
-
Wang, J.1
Sciortino, P.2
Liu, F.3
Yuan, P.4
Deng, X.5
Walters, F.6
Liu, X.7
Bacon, J.8
Chen, L.9
-
11
-
-
31744432956
-
-
J. Wang, X. Deng, P. Sciortino, R. Varghese, A. Nikolov, F. Liu, X. Liu, and L. Chen, Proc. SPIE 5931, 59310C (2005).
-
(2005)
Proc. SPIE
, vol.5931
-
-
Wang, J.1
Deng, X.2
Sciortino, P.3
Varghese, R.4
Nikolov, A.5
Liu, F.6
Liu, X.7
Chen, L.8
-
12
-
-
27744489031
-
-
D.H. Kim, J.G. Im, S.S. Lee, S.W. Ahn, and K.D.Lee, IEEE Photo. Technol. Lett. 17, 2352 (2005).
-
(2005)
IEEE Photo. Technol. Lett
, vol.17
, pp. 2352
-
-
Kim, D.H.1
Im, J.G.2
Lee, S.S.3
Ahn, S.W.4
Lee, K.D.5
-
13
-
-
33645073009
-
-
Y. Ekinici, H.H.Solak, C. David, and H. Sigg, Opt. Express 14, 2323 (2006).
-
(2006)
Opt. Express
, vol.14
, pp. 2323
-
-
Ekinici, Y.1
Solak, H.H.2
David, C.3
Sigg, H.4
-
14
-
-
21244498219
-
-
M. Xu, H.P. Urbach, D.K.G. de Boer, and H.J. Cornelissen, Opt. Express 13,2303 (2005).
-
(2005)
Opt. Express
, vol.13
, pp. 2303
-
-
Xu, M.1
Urbach, H.P.2
de Boer, D.K.G.3
Cornelissen, H.J.4
-
15
-
-
33749480858
-
-
J.J. Wang, L. Chen, X. Liu, P. Sciorino, F. Liu, F. Walters, and X. Deng, Appl. Phys. Lett. 89, 141105 (2006).
-
(2006)
Appl. Phys. Lett
, vol.89
, pp. 141105
-
-
Wang, J.J.1
Chen, L.2
Liu, X.3
Sciorino, P.4
Liu, F.5
Walters, F.6
Deng, X.7
-
17
-
-
12744281843
-
-
S
-
J.S. Kim, K.D. Lee, S.W. Ahn, S.H. Kim, J.D. Park, S.E. Lee, and S.S. Yoon, J. Korean Phys. Soc. 45, S890 (2004).
-
(2004)
J. Korean Phys. Soc
, vol.45
, pp. 890
-
-
Kim, J.S.1
Lee, K.D.2
Ahn, S.W.3
Kim, S.H.4
Park, J.D.5
Lee, S.E.6
Yoon, S.S.7
-
18
-
-
0035519821
-
-
Z. Yu, W. Wu, L. Chen, and S.Y. Chou, J. Vac. Sci. Technol. B 19, 2816 (2001).
-
(2001)
J. Vac. Sci. Technol. B
, vol.19
, pp. 2816
-
-
Yu, Z.1
Wu, W.2
Chen, L.3
Chou, S.Y.4
-
19
-
-
14944383747
-
-
S.W. Ahn, K.D. Lee, J.S. Kim, S.H. Kim, S.H. Lee, J.D. Park, and P.W. Yoon, Microelectron. Eng. 78-79, 314 (2005).
-
(2005)
Microelectron. Eng
, vol.78-79
, pp. 314
-
-
Ahn, S.W.1
Lee, K.D.2
Kim, J.S.3
Kim, S.H.4
Lee, S.H.5
Park, J.D.6
Yoon, P.W.7
-
21
-
-
0031273459
-
-
P.M. Mensz, P. Kellawon, R. Van Roijen, P. Kozodoy, and S. Denbaars, Electron. Lett. 33, 2066 (1997).
-
(1997)
Electron. Lett
, vol.33
, pp. 2066
-
-
Mensz, P.M.1
Kellawon, P.2
Van Roijen, R.3
Kozodoy, P.4
Denbaars, S.5
-
22
-
-
3042702992
-
-
J.K. Kim, T. Gessmann, H. Luo, and E.F. Schubert, Appl. Phys. Lett. 84 4508 (2004).
-
(2004)
Appl. Phys. Lett
, vol.84
, pp. 4508
-
-
Kim, J.K.1
Gessmann, T.2
Luo, H.3
Schubert, E.F.4
-
23
-
-
0038311836
-
-
C. Huh, K.-S. Lee, E.-J. Kang, and S.-J. Park, J. Appl. Phys. 93 9383 (2003).
-
(2003)
J. Appl. Phys
, vol.93
, pp. 9383
-
-
Huh, C.1
Lee, K.-S.2
Kang, E.-J.3
Park, S.-J.4
-
24
-
-
51149220122
-
-
I. Schnitzer, E. Yablonovitch, C. Caneau, T.J. Gmitter, and A. Scherer, Appl. Phys. Lett. 63 2174 (1993).
-
(1993)
Appl. Phys. Lett
, vol.63
, pp. 2174
-
-
Schnitzer, I.1
Yablonovitch, E.2
Caneau, C.3
Gmitter, T.J.4
Scherer, A.5
-
25
-
-
0032607399
-
-
R. Windisch, P. Herernans, A. Knobloch, P. Kiesel, G.H. Döhler, B. Dutta, and G. Borghs, Appl. Phys. Lett. 74 2256 (1999).
-
(1999)
Appl. Phys. Lett
, vol.74
, pp. 2256
-
-
Windisch, R.1
Herernans, P.2
Knobloch, A.3
Kiesel, P.4
Döhler, G.H.5
Dutta, B.6
Borghs, G.7
-
26
-
-
1542315187
-
-
T. Fujii, Y. Gao, R. Sharma, E.L. Hu, S.P. DenBaars, and S. Nakamura, Appl. Phys. Lett. 84 855 (2004).
-
(2004)
Appl. Phys. Lett
, vol.84
, pp. 855
-
-
Fujii, T.1
Gao, Y.2
Sharma, R.3
Hu, E.L.4
DenBaars, S.P.5
Nakamura, S.6
-
28
-
-
0032622136
-
-
M. Borodisky, T.F. Krauss, R. Coccioli, R. Brijen, R. Bhat, and E. Yablonovitch, Appl. Phys. Lett. 75 1036 (1999).
-
(1999)
Appl. Phys. Lett
, vol.75
, pp. 1036
-
-
Borodisky, M.1
Krauss, T.F.2
Coccioli, R.3
Brijen, R.4
Bhat, R.5
Yablonovitch, E.6
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