High-quality transition fault ATPG for small delay defects

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 26, Issue 5, 2007, Pages 983-989

  Kumar, Mahilchi Milir Vaseekar ^a   Tragoudas, Spyros ^a  

^a Southern Illinois University at Carbondale   (United States)

Author keywords

Automatic test pattern generation (ATPG); Boolean algebraic test generation; Delay faults; Testing

Indexed keywords

AUTOMATIC TEST PATTERN GENERATION; DEFECTS; NETWORKS (CIRCUITS);

ALGEBRAIC TEST GENERATION; DELAY FAULTS; QUALITY TESTS;

BOOLEAN ALGEBRA;

EID: 34248549242     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCAD.2006.884863     Document Type: Article

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