Electrical Characterization of Metal-Molecule-Silicon Junctions

Annals of the New York Academy of Sciences

Volumn 1006, Issue , 2003, Pages 36-47

  Wang, W ^a   Lee, T ^a   Kamdar, M ^a   Reed, M A ^a   Stewart, M P ^b   Hwang, J J ^b   Tour, J M ^b  

^a YALE UNIVERSITY   (United States)

^b RICE UNIVERSITY   (United States)

Author keywords

Diazonium; Hybrid organic semiconductor devices; Silicon; Tunneling

Indexed keywords

4 (TRIMETHYLSILYLETHYNYL)BENZENEDIAZONIUM TETRAFLUOROBORATE; 4 (TRIMETHYLSILYLETHYNYL)PHENYLENE; ALKENE DERIVATIVE; BORIC ACID; DIAZONIUM COMPOUND; METAL; OXIDE; SILICON; UNCLASSIFIED DRUG;

CONFERENCE PAPER; DEVICE; ELECTRIC CURRENT; ELECTRIC POTENTIAL; ELECTRICITY; ELECTRON TRANSPORT; MEASUREMENT; SAMPLING; SEMICONDUCTOR; SURFACE PROPERTY; TEMPERATURE DEPENDENCE;

EID: 0346689983     PISSN: 00778923     EISSN: None     Source Type: Book Series    
DOI: 10.1196/annals.1292.002     Document Type: Conference Paper

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