Analysis of capacitance-potential measurements at the silicon-electrolyte interface revisited

Journal of Physical Chemistry C

Volumn 111, Issue 14, 2007, Pages 5497-5499

  Allongue, P ^a   Chazalviel, J N ^a   Henry De Villeneuve, C ^a   Ozanam, F ^a  

^a LABORATOIRE DE PHYSIQUE DE LA MATIÈRE CONDENSÉE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; ELECTRIC SPACE CHARGE; ELECTROLYTES; PERMITTIVITY; POISSON DISTRIBUTION; SILICON;

BIAS DEPENDENCE; CAPACITANCE-POTENTIAL MEASUREMENTS; POISSON-BOLTZMANN ANALYSIS; SILICON-ELECTROLYTE INTERFACES;

INTERFACES (MATERIALS);

EID: 34248171626     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp068614z     Document Type: Article

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