Conducting atomic force microscopy studies of InN nanocomposite layers having conducting and nonconducting phases

Journal of Applied Physics

Volumn 101, Issue 8, 2007, Pages

  Mann, Ajay Kumar ^a   Varandani, Deepak ^a   Mehta, Bodh Raj ^a   Malhotra, Lalit Kumar ^a  

^a INDIAN INSTITUTE OF TECHNOLOGY DELHI   (India)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTALLINE MATERIALS; DEPOSITION; INDIUM COMPOUNDS; PARAMETER ESTIMATION; VOLUME FRACTION;

CRYSTALLINITY; NONCONDUCTING PHASES; POSTDEPOSITION ANNEALING;

NANOCOMPOSITES;

EID: 34247639573     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2718289     Document Type: Article

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