Flash memory testing and built-in self-diagnosis with march-like test algorithms

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 26, Issue 6, 2007, Pages 1101-1112

  Yeh, Jen Chieh ^a,b   Cheng, Kuo Liang ^a,b   Chou, Yung Fa ^a,b   Wu, Cheng Wen ^a,b  

^a IEEE   (Taiwan)

^b NATIONAL TSING HUA UNIVERSITY   (Taiwan)

Author keywords

Built in self diagnosis (BISD); Built in self test (BIST); Fault diagnosis; Flash memory; March like test; Memory testing

Indexed keywords

BUILT IN SELF DIAGNOSIS (BISD); MARCH LIKE TEST; MEMORY TESTING; SYSTEM ON CHIP;

ALGORITHMS; BUILT-IN SELF TEST; COMPUTER SIMULATION; EMBEDDED SYSTEMS; FAILURE ANALYSIS; GATES (TRANSISTOR); MICROPROCESSOR CHIPS; NONVOLATILE STORAGE;

FLASH MEMORY;

EID: 34247578773     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCAD.2006.885828     Document Type: Article

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