Flash memory built-in self-test using march-like algorithms

Proceedings - 1st IEEE International Workshop on Electronic Design, Test and Applications, DELTA 2002

Volumn , Issue , 2002, Pages 137-141

  Yeh, Jen Chieh ^a   Wu, Chi Feng ^a   Cheng, Kuo Liang ^a   Chou, Yung Fa ^a   Huang, Chih Tsun ^a   Wu, Cheng Wen ^a  

^a NATIONAL TSING HUA UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; APPLICATION SPECIFIC INTEGRATED CIRCUITS; BUILT-IN SELF TEST; DATA STORAGE EQUIPMENT; DIGITAL STORAGE; MICROPROCESSOR CHIPS; MONOLITHIC MICROWAVE INTEGRATED CIRCUITS; PROGRAMMABLE LOGIC CONTROLLERS; SEMICONDUCTOR DEVICE MANUFACTURE; SYSTEM-ON-CHIP;

EMBEDDED FLASH MEMORY; FLOATING GATE TRANSISTORS; MEMORY BUILT IN SELF TESTS; MEMORY FAULTS; NON-VOLATILE MEMORY; SYSTEM ON CHIPS (SOC); TEST ALGORITHMS; TEST PROCEDURES;

FLASH MEMORY;

EID: 84916235652     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DELTA.2002.994602     Document Type: Conference Paper

References (10)

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