Self-learning signature analysis for non-volatile memory testing

IEEE International Test Conference (TC)

Volumn , Issue , 1996, Pages 303-308

  Olivo, Piero ^a   Dalpasso, Marcello ^a  

^a UNIVERSITY OF FERRARA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC TESTING; COMPUTER PROGRAMMING; LEARNING ALGORITHMS; NONVOLATILE STORAGE; STORAGE ALLOCATION (COMPUTER); VLSI CIRCUITS;

BUILT IN SELF TEST (BIST) TECHNIQUES; SELF LEARNING SIGNATURE ANALYSIS;

INTEGRATED CIRCUIT TESTING;

EID: 0030385619     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)