Flash memory built-in self-diagnosis with test mode control

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 2005, Pages 15-20

  Yeh, Jen Chieh ^a   Lai, Yan Ting ^a   Shih, Yuan Yuan ^a   Wu, Cheng Wen ^a   Ho, Chien Hung ^b   Lin, Yen Tai ^b  

^a NATIONAL TSING HUA UNIVERSITY   (Taiwan)

^b EMEMORY TECHNOLOGY INC   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

AREA OVERHEAD; BUILT-IN SELF-DIAGNOSIS; FLASH MEMORY CHIP; INDUSTRIAL CHIPS; MARKET GROWTH; MEMORY TESTING; MODE CONTROL; PRODUCTION YIELD;

FLASH MEMORY; PARALLEL PROGRAMMING;

BUILT-IN SELF TEST;

EID: 33751075352     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VTS.2005.45     Document Type: Conference Paper

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