Epitaxially grown single grain boundaries in chalcopyrites

Journal of Physics Condensed Matter

Volumn 19, Issue 1, 2007, Pages

  Siebentritt, Susanne ^a,b   Eisenbarth, Tobias ^a   Rockett, Angus ^c   Albert, Jürgen ^a   Schubert Bischoff, Peter ^a   Lux Steiner, Martha Ch ^a,b  

^a HAHN MEITNER INSTITUT   (Germany)

^b FREIE UNIVERSITÄT BERLIN   (Germany)

^c University of Illinois at Urbana Champaign   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BACKSCATTERING; ELECTRON DIFFRACTION; EPITAXIAL GROWTH; GRAIN BOUNDARIES; HIGH RESOLUTION ELECTRON MICROSCOPY; METALLORGANIC VAPOR PHASE EPITAXY; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

CHALCOPYRITES; ELECTRON BACK-SCATTERING DIFFRACTION (EBSD); TETRAGONAL FILMS;

SINGLE CRYSTALS;

EID: 33847196135     PISSN: 09538984     EISSN: 1361648X     Source Type: Journal    
DOI: 10.1088/0953-8984/19/1/016004     Document Type: Article

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