Analysis and modeling of subthreshold leakage of RT-components under PTV and state variation

Proceedings of the International Symposium on Low Power Electronics and Design

Volumn 2006, Issue , 2006, Pages 220-225

  Helms, Domenik ^a   Ehmen, Günter ^a   Nebel, Wolfgang ^b  

^a OFFIS INSTITUTE FOR INFORMATION TECHNOLOGY   (Germany)

^b UNIVERSITY OF OLDENBURG   (Germany)

Author keywords

Leakage; Modeling; Process variation; State dependence

Indexed keywords

COMPUTER SIMULATION; ELECTRIC NETWORK ANALYSIS; MEASUREMENT ERRORS; MOS DEVICES; THRESHOLD VOLTAGE;

PROCESS VARIATION; STATE DEPENDENCE;

LEAKAGE CURRENTS;

EID: 34247280480     PISSN: 15334678     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1165573.1165628     Document Type: Conference Paper

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