Probing heterogeneous electron transfer at an unbiased conductor by scanning electrochemical microscopy in the feedback mode

Analytical Chemistry

Volumn 79, Issue 7, 2007, Pages 2735-2744

  Xiong, Hui ^a   Guo, Jidong ^a   Amemiya, Shigeru ^a  

^a UNIVERSITY OF PITTSBURGH   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; DIFFUSION; ELECTRIC CURRENTS; ELECTRONS; PROBLEM SOLVING; SUBSTRATES;

FEEDBACK MODES; SCANNING ELECTROCHEMICAL MICROSCOPY;

TRANSPORT PROPERTIES;

ANALYTIC METHOD; ARTICLE; CONDUCTOR; ELECTRON TRANSPORT; FEEDBACK SYSTEM; MATHEMATICAL ANALYSIS; MICROELECTRODE; SCANNING ELECTROCHEMICAL MICROSCOPY; SIMULATION; THEORY;

ELECTRIC CONDUCTIVITY; ELECTROCHEMISTRY; ELECTRONS; FEEDBACK; MICROSCOPY, SCANNING PROBE; MODELS, THEORETICAL; SENSITIVITY AND SPECIFICITY;

EID: 34247177978     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac062089i     Document Type: Article

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