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1
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0344704193
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For recent reviews describing the many applications of SECM, see for example: (a) M. Arca, A. J. Bard, B. R. Horrocks, T. C. Richards and D. A. Treichel, Analyst, 1994, 119, 719;
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Analyst
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2
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(b) A. J. Bard, F-R. F. Fan and M. V. Mirkin, in Electroanalytical Chemistry, ed. A. J. Bard, Marcel Dekker, New York, 1993, vol. 18, p. 243;
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Electroanalytical Chemistry
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Bard, A.J.1
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8
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(a) N. Casillas, S. J. Charlebois, W. H. Smyrl and H. S. White, J. Electrochem. Soc., 1993, 140, L142;
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(b) N. Casillas, S. J. Charlebois, W. H. Smyrl and H. S. White, J. Electrochem. Soc., 1994, 141, 636.
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10
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0001045691
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O. E. Husser, D. H. Craston and A. J. Bard, J. Vac. Sci. Technol. B, 1988, 6, 1873.
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Husser, O.E.1
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12
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37049089120
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S. Meltzer and D. Mandler, J. Chem. Soc., Faraday Trans., 1995, 91, 1019.
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J. V. Macpherson and P. R. Unwin, J. Chem. Soc., Faraday Trans., 1993, 89, 1883.
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Macpherson, J.V.1
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18
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0011120461
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For recent reviews of techniques for studying dissolution kinetics see: (a) P. R. Unwin and J. V. Macpherson, Chem. Soc. Rev., 1995, 24, 109;
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A. J. Bard, F-R. F. Fan, J. Kwak and O. Lev, Anal. Chem., 1989, 61, 132.
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Bard, A.J.1
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ed. A. J. Bard, Marcel Dekker, New York
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(b) R. M. Wightman and D. O. Wipf, in Electroanalytical Chemistry, ed. A. J. Bard, Marcel Dekker, New York, 1989, vol. 15, p. 267
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Wightman, R.M.1
Wipf, D.O.2
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24
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33751500517
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For other studies of fast kinetics with SECM, see for example: (a) P. R. Unwin and A. J. Bard, J. Phys. Chem., 1991, 95, 7814;
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(1991)
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(b) F. Zhou, P. R. Unwin and A. J. Bard, J. Phys. Chem., 1992, 96, 4917;
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(e) M. V. Mirkin, L. O. S. Bulhoes and A. J. Bard, J. Am. Chem. Soc., 1993, 115, 201;
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Mirkin, M.V.1
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(f) M. V. Mirkin, T. C. Richards and A. J. Bard, J. Phys. Chem., 1993, 97, 7672;
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(h) D. A. Treichel, M. V. Mirkin and A. J. Bard, J. Phys. Chem., 1994, 98, 5751.
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(a) G. Faita, G. Fiori and T. Mussini, Electrochim. Acta, 1968, 13, 1765;
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(c) R. G. Compton, G. M. Stearn, P. R. Unwin and A. J. Barwise, J. Appl. Electrochem., 1988, 18, 657.
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