Theory of scanning electrochemical microscopy (SECM) as a probe of surface conductivity

Physical Chemistry Chemical Physics

Volumn 7, Issue 2, 2005, Pages 356-365

  Whitworth, Anna L ^a   Mandler, Daniel ^a,b   Unwin, Patrick R ^a  

^a UNIVERSITY OF WARWICK   (United Kingdom)

^b HEBREW UNIVERSITY OF JERUSALEM   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

WATER;

CONDUCTANCE; DIFFUSION; FEEDBACK SYSTEM; FILM; METHODOLOGY; MICROELECTRODE; OXIDATION; REDUCTION; REVIEW; SCANNING ELECTROCHEMICAL MICROSCOPY; SURFACE PROPERTY; THEORY; THICKNESS;

EID: 12744269236     PISSN: 14639076     EISSN: None     Source Type: Journal    
DOI: 10.1039/b407397e     Document Type: Review

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