Secondary ion mass spectrometry of MCsn+ molecular ion complexes

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 258, Issue 1, 2007, Pages 218-225

  Saha, Biswajit ^a   Chakraborty, Purushottam ^a  

^a SAHA INSTITUTE OF NUCLEAR PHYSICS   (India)

Author keywords

Cs+ primary ions; Electronegative elements; Formation mechanisms; MCsn+ molecular ions; Secondary ion mass spectrometry

Indexed keywords

COMPLEXATION; CONCENTRATION (PROCESS); ELECTROCHEMICAL PROPERTIES; ELECTRON EMISSION; MOLECULAR DYNAMICS; SECONDARY ION MASS SPECTROMETRY;

FORMATION MECHANISMS; MATRIX EFFECTS; MOLECULAR ION COMPLEXES; SURFACE REGIONS;

POSITIVE IONS;

EID: 34147146991     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2006.12.172     Document Type: Article

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