Preferential oxygen-trapping in metallic multilayers: A SIMS perspective

Journal of the Chinese Chemical Society

Volumn 48, Issue 3, 2001, Pages 521-524

  Sarkar, Subhendu ^a   Chakraborty, Purushottam ^a  

^a SAHA INSTITUTE OF NUCLEAR PHYSICS   (India)

Author keywords

Matrix effect; Metallic multilayers; SIMS; Sputter deposition

Indexed keywords

EID: 0142130086     PISSN: 00094536     EISSN: None     Source Type: Journal    
DOI: 10.1002/jccs.200100078     Document Type: Review

References (5)

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2. Wilson, R. G.; Stevie, F. A.; Magee, C. W. SIMS: A Practical Handbook for Depth Profiling and Bulk Impurity Analysis; Wiley: NY, 1989.
3. Chakraborty, P. Pramana-J. Phys. 1998, 50, 617.
4. Hoffman, S. Surf. Interface Analysis. 1994, 21, 673.
5. Sarkar, S.; Datta, A.; Chakraborty, P. Proc. DAE Solid State Phys. Symposium; India, 2000.