The influence of the surface binding energy on the emission of MCs+ secondary ions from elemental targets in secondary ion mass spectrometry

International Journal of Mass Spectrometry and Ion Processes

Volumn 152, Issue 2-3, 1996, Pages 209-216

  Mootz, T ^a   Adams, F ^a  

^a UNIVERSITY OF ANTWERP   (Belgium)

Author keywords

Cesium bombardment; Energy distributions; Metal cesium secondary ion formation; Secondary ion mass spectrometry; Spatial and time correlated emission

Indexed keywords

EID: 0000702654     PISSN: 01681176     EISSN: None     Source Type: Journal    
DOI: 10.1016/0168-1176(95)04346-2     Document Type: Article

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